Conical etched ion tracks in SiO2 characterised by small angle X-ray scattering

Citation

Hadley, A, Notthoff, C, Mota Santiago, P et al. 2017, 'Conical etched ion tracks in SiO2 characterised by small angle X-ray scattering', Nuclear Instruments and Methods in Physics Research: Section B, vol. 435, pp. 133-136.

Year

2017

Field of Research

  • Surfaces And Structural Properties Of Condensed Matter

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