Characterization of Epitaxial Heavily Doped Silicon Regions Formed by Hot-Wire Chemical Vapor Deposition Using Micro-Raman and Microphotoluminescence Spectroscopy

Citation

Rahman, T, Nguyen, H, Tarazona, A et al 2018, 'Characterization of Epitaxial Heavily Doped Silicon Regions Formed by Hot-Wire Chemical Vapor Deposition Using Micro-Raman and Microphotoluminescence Spectroscopy', IEEE Journal of Photovoltaics, vol. 8, no. 3, pp. 813-819.

Year

2018

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