Characterization of Epitaxial Heavily Doped Silicon Regions Formed by Hot-Wire Chemical Vapor Deposition Using Micro-Raman and Microphotoluminescence Spectroscopy
Citation
Rahman, T, Nguyen, H, Tarazona, A et al 2018, 'Characterization of Epitaxial Heavily Doped Silicon Regions Formed by Hot-Wire Chemical Vapor Deposition Using Micro-Raman and Microphotoluminescence Spectroscopy', IEEE Journal of Photovoltaics, vol. 8, no. 3, pp. 813-819.