Measurement of latent tracks in amorphous SiO2 using small angle X-ray scattering

Citation

Kluth, P, Schnohr, C, Sprouster, D et al. 2008, 'Measurement of latent tracks in amorphous SiO2 using small angle X-ray scattering', Nuclear Instruments and Methods in Physics Research: Section B, vol. 266, no. 12-13, pp. 2994-2997.

Year

2008

Field of Research

  • Condensed Matter Physics Not Elsewhere Classified

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