Measurement of latent tracks in amorphous SiO2 using small angle X-ray scattering
Citation
Kluth, P, Schnohr, C, Sprouster, D et al. 2008, 'Measurement of latent tracks in amorphous SiO2 using small angle X-ray scattering', Nuclear Instruments and Methods in Physics Research: Section B, vol. 266, no. 12-13, pp. 2994-2997.Year
2008ANU Authors
Field of Research
- Condensed Matter Physics Not Elsewhere Classified