Resonant Controller for Fast Atomic Force Microscopy

Citation

Das, S, Pota, H & Petersen, I 2012, 'Resonant Controller for Fast Atomic Force Microscopy', 51st IEEE Conference on Decision and Control (CDC 2012), Institute of Electrical and Electronics Engineers (IEEE Inc), Piscataway, New Jersey, US, pp. 2471-2476pp.

Year

2012

Field of Research

  • Engineering Not Elsewhere Classified

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