Spiral scanning of atomic force microscope for faster imaging

Citation

Rana, M, Pota, H, Petersen, I et al. 2013, 'Spiral scanning of atomic force microscope for faster imaging', 52nd IEEE Conference on Decision and Control, CDC 2013, Institute of Electrical and Electronics Engineers (IEEE Inc), USA, pp. 354 - 359.

Year

2013

ANU Authors

Field of Research

  • Control Systems, Robotics And Automation

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