Model predictive control of... - Researchers

Model predictive control of atomic force microscope for fast image scanning

Citation

Rana, M, Pota, H & Petersen, I 2012, 'Model predictive control of atomic force microscope for fast image scanning', 51st IEEE Conference on Decision and Control (CDC 2012), Institute of Electrical and Electronics Engineers (IEEE Inc), Piscataway, New Jersey, US, pp. 2477 - 2482.

Year

2012

ANU Authors

Professor Ian Petersen

Field of Research

Control Systems, Robotics And Automation

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