Detecting Dopant Diffusion ... - Researchers

Detecting Dopant Diffusion Enhancement at Grain Boundaries in Multicrystalline Silicon Wafers with Microphotoluminescence Spectroscopy

Citation

Nguyen, H, Mokkapati, S & MacDonald, D 2017, 'Detecting Dopant Diffusion Enhancement at Grain Boundaries in Multicrystalline Silicon Wafers with Microphotoluminescence Spectroscopy', IEEE Journal of Photovoltaics, vol. 7, no. 2, pp. 598-603.

Year

2017

ANU Authors

Dr Hieu Nguyen
Professor Daniel MacDonald

Fields of Research

Structural Chemistry And Spectroscopy
Photodetectors, Optical Sensors And Solar Cells

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