Detecting Dopant Diffusion Enhancement at Grain Boundaries in Multicrystalline Silicon Wafers with Microphotoluminescence Spectroscopy

Citation

Nguyen, H, Mokkapati, S & MacDonald, D 2017, 'Detecting Dopant Diffusion Enhancement at Grain Boundaries in Multicrystalline Silicon Wafers with Microphotoluminescence Spectroscopy', IEEE Journal of Photovoltaics, vol. 7, no. 2, pp. 598-603.

Year

2017

Fields of Research

  • Structural Chemistry And Spectroscopy
  • Photodetectors, Optical Sensors And Solar Cells

Updated:  27 January 2023 / Responsible Officer:  Director (Research Services Division) / Page Contact:  Researchers