Precipitation of Cu and Ni in n- and p-type Czochralski-grown silicon characterized by photoluminescence imaging
Citation
Sun, C, Nguyen, H, Rougieux, F et al 2017, 'Precipitation of Cu and Ni in n- and p-type Czochralski-grown silicon characterized by photoluminescence imaging', Journal of Crystal Growth, vol. 460, pp. 98-104pp.Year
2017ANU Authors
Field of Research
- Chemical Engineering Design