Microscopic Distributions of Defect Luminescence from Subgrain Boundaries in Multicrystalline Silicon Wafers

Citation

Nguyen, H, Jensen, M, Li, L et al 2017, 'Microscopic Distributions of Defect Luminescence from Subgrain Boundaries in Multicrystalline Silicon Wafers', IEEE Journal of Photovoltaics, vol. 7, no. 3, pp. 772-780.

Year

2017

Field of Research

  • Photodetectors, Optical Sensors And Solar Cells

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