Evaluating Depth Distributions of Dislocations in Silicon Wafers Using Micro-Photoluminescence Excitation Spectroscopy
Citation
Nguyen, H, Phang, S & MacDonald, D 2016, 'Evaluating Depth Distributions of Dislocations in Silicon Wafers Using Micro-Photoluminescence Excitation Spectroscopy', Energy Procedia, vol. 92, pp. 145-152pp.Year
2016ANU Authors
Field of Research
- Processor Architectures