Characterization of Cu and Ni Precipitates in n- and p-type Czochralski-grown Silicon by Photoluminescence
Citation
Sun, C, Nguyen, H, Rougieux, F et al 2016, 'Characterization of Cu and Ni Precipitates in n- and p-type Czochralski-grown Silicon by Photoluminescence', 6th International Conference on Crystalline Silicon Photovoltaics, SiliconPV 2016, ed. A Weeber, J Poortmans, Elserier, TBC, pp. 880-885.Year
2016ANU Authors
Field of Research
- Processor Architectures