Characterization of Cu and Ni Precipitates in n- and p-type Czochralski-grown Silicon by Photoluminescence

Citation

Sun, C, Nguyen, H, Rougieux, F et al 2016, 'Characterization of Cu and Ni Precipitates in n- and p-type Czochralski-grown Silicon by Photoluminescence', 6th International Conference on Crystalline Silicon Photovoltaics, SiliconPV 2016, ed. A Weeber, J Poortmans, Elserier, TBC, pp. 880-885.

Year

2016

Field of Research

  • Processor Architectures

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