Two-dimensional Kikuchi patterns of Si as measured using an electrostatic analyser
Citation
Vos, M & Winkelmann, A 2016, 'Two-dimensional Kikuchi patterns of Si as measured using an electrostatic analyser', Ultramicroscopy, vol. 171, pp. 19-25.Year
2016ANU Authors
Fields of Research
- Particle Physics
- Lasers And Quantum Electronics