Two-dimensional Kikuchi patterns of Si as measured using an electrostatic analyser

Citation

Vos, M & Winkelmann, A 2016, 'Two-dimensional Kikuchi patterns of Si as measured using an electrostatic analyser', Ultramicroscopy, vol. 171, pp. 19-25.

Year

2016

Fields of Research

  • Lasers And Quantum Electronics
  • Particle Physics

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