Accurate measurement of extremely low surface recombination velocities on charged, oxidized silicon surfaces using a simple metal-oxide-semiconductor structure
Citation
Jellett, W & Weber, K 2007, 'Accurate measurement of extremely low surface recombination velocities on charged, oxidized silicon surfaces using a simple metal-oxide-semiconductor structure', Applied Physics Letters, vol. 90, no. 4, p. 142104.Year
2007ANU Authors
Field of Research
- Materials Engineering Not Elsewhere Classified
