Accurate measurement of extremely low surface recombination velocities on charged, oxidized silicon surfaces using a simple metal-oxide-semiconductor structure

Citation

Jellett, W & Weber, K 2007, 'Accurate measurement of extremely low surface recombination velocities on charged, oxidized silicon surfaces using a simple metal-oxide-semiconductor structure', Applied Physics Letters, vol. 90, no. 4, p. 142104.

Year

2007

ANU Authors

Field of Research

  • Materials Engineering Not Elsewhere Classified

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