Characterizing the Influenc... - Researchers

Characterizing the Influence of Crystal Orientation on Surface Recombination in Silicon Wafers

Citation

Sio, H, Chong, T, Surve, S et al. 2016, 'Characterizing the Influence of Crystal Orientation on Surface Recombination in Silicon Wafers', IEEE Journal of Photovoltaics, vol. 6, no. 2, pp. 412-418.

Year

2016

ANU Authors

Professor Klaus Weber
Professor Daniel MacDonald

Field of Research

Elemental Semiconductors

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