Characterizing the Influence of Crystal Orientation on Surface Recombination in Silicon Wafers
Citation
Sio, H, Chong, T, Surve, S et al. 2016, 'Characterizing the Influence of Crystal Orientation on Surface Recombination in Silicon Wafers', IEEE Journal of Photovoltaics, vol. 6, no. 2, pp. 412-418.Year
2016ANU Authors
Field of Research
- Elemental Semiconductors