Impact of nickel contamination on carrier recombination in n- and p-type crystalline silicon wafers

Citation

MacDonald, D 2005, 'Impact of nickel contamination on carrier recombination in n- and p-type crystalline silicon wafers', Applied Physics A: Materials Science and Processing, vol. 81, no. 8, pp. 1619-1625.

Year

2005

Field of Research

  • Electrical And Electronic Engineering Not Elsewhere Classified

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