Impact of nickel contamination on carrier recombination in n- and p-type crystalline silicon wafers
Citation
MacDonald, D 2005, 'Impact of nickel contamination on carrier recombination in n- and p-type crystalline silicon wafers', Applied Physics A: Materials Science and Processing, vol. 81, no. 8, pp. 1619-1625.Year
2005ANU Authors
Field of Research
- Electrical And Electronic Engineering Not Elsewhere Classified