Characterization of ion track morphology formed by swift heavy ion irradiation in silicon oxynitride films

Citation

Mota Santiago, P, Schauries, D, Nadzri, A et al. 2015, 'Characterization of ion track morphology formed by swift heavy ion irradiation in silicon oxynitride films', Heavy-Ion Accelerator Symposium, HIAS 2014, ed. M.Lee B.Q.Simenel C., EDP Sciences, TBC.

Year

2015

Field of Research

  • Surfaces And Structural Properties Of Condensed Matter

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