Grown-in defects limiting the bulk lifetime of p-type float-zone silicon wafers
Citation
Grant, N, Rougieux, F, MacDonald, D et al 2015, 'Grown-in defects limiting the bulk lifetime of p-type float-zone silicon wafers', Journal of Applied Physics, vol. 117, no. 5, pp. 1-8pp.Year
2015ANU Authors
Field of Research
- Photodetectors, Optical Sensors And Solar Cells