Grown-in defects limiting the bulk lifetime of p-type float-zone silicon wafers

Citation

Grant, N, Rougieux, F, MacDonald, D et al 2015, 'Grown-in defects limiting the bulk lifetime of p-type float-zone silicon wafers', Journal of Applied Physics, vol. 117, no. 5, pp. 1-8pp.

Year

2015

Field of Research

  • Photodetectors, Optical Sensors And Solar Cells

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