Influence of Annealing and Bulk Hydrogenation on Lifetime-Limiting Defects in Nitrogen-Doped Floating Zone Silicon

Citation

Rougieux, F, Grant, N, Barugkin, C et al 2015, 'Influence of Annealing and Bulk Hydrogenation on Lifetime Limiting Defects in Nitrogen-Doped Floating Zone Silicon', IEEE Journal of Photovoltaics, vol. 5, no. 2, p. 495.

Year

2015

Field of Research

  • Photodetectors, Optical Sensors And Solar Cells

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