Influence of Annealing and Bulk Hydrogenation on Lifetime-Limiting Defects in Nitrogen-Doped Floating Zone Silicon
Citation
Rougieux, F, Grant, N, Barugkin, C et al 2015, 'Influence of Annealing and Bulk Hydrogenation on Lifetime Limiting Defects in Nitrogen-Doped Floating Zone Silicon', IEEE Journal of Photovoltaics, vol. 5, no. 2, p. 495.Year
2015ANU Authors
Field of Research
- Photodetectors, Optical Sensors And Solar Cells