Impact of grown-in point-defects on the minority carrier lifetime in Czochralski-grown silicon wafers

Citation

Rougieux, F, Grant, N & MacDonald, D 2014, 'Impact of grown-in point-defects on the minority carrier lifetime in Czochralski-grown silicon wafers', E-MRS Spring Meeting 2014 Symposium Y - Advanced materials and characterization techniques for solar cells II, 2014, ed. H.Turan R.Valenta J., Conference Organising Committee, TBC, pp. 81-84.

Year

2014

Fields of Research

  • Asian History
  • European History (Excl. British, Classical Greek And Roman)

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