Impact of grown-in point-defects on the minority carrier lifetime in Czochralski-grown silicon wafers
Citation
Rougieux, F, Grant, N & MacDonald, D 2014, 'Impact of grown-in point-defects on the minority carrier lifetime in Czochralski-grown silicon wafers', E-MRS Spring Meeting 2014 Symposium Y - Advanced materials and characterization techniques for solar cells II, 2014, ed. H.Turan R.Valenta J., Conference Organising Committee, TBC, pp. 81-84.
Year
2014
Fields of Research
- Asian History
- European History (Excl. British, Classical Greek And Roman)
