Comparison between secondary electron microscopy dopant contrast image (SEMDCI) and electron beam induced current (EBIC) for laser doping of crystalline silicon
Citation
Xu, L, Hameiri, Z, Weber, K et al 2014, 'Comparison between secondary electron microscopy dopant contrast image (SEMDCI) and electron beam induced current (EBIC) for laser doping of crystalline silicon', 4th International Conference on Crystalline Silicon Photovoltaics, SiliconPV 2014, ed. e A.Sinton R.Hahn G., Elsevier, Netherlands, pp. 179-185.
Year
2014
Field of Research
- Photodetectors, Optical Sensors And Solar Cells