Comparison between secondary electron microscopy dopant contrast image (SEMDCI) and electron beam induced current (EBIC) for laser doping of crystalline silicon

Citation

Xu, L, Hameiri, Z, Weber, K et al 2014, 'Comparison between secondary electron microscopy dopant contrast image (SEMDCI) and electron beam induced current (EBIC) for laser doping of crystalline silicon', 4th International Conference on Crystalline Silicon Photovoltaics, SiliconPV 2014, ed. e A.Sinton R.Hahn G., Elsevier, Netherlands, pp. 179-185.

Year

2014

ANU Authors

Field of Research

  • Photodetectors, Optical Sensors And Solar Cells

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