Quantitative surface recombination imaging of single side processed silicon wafers obtained by photoluminescence modeling

Citation

Fell, A, Walter, D, Yang, X et al 2014, 'Quantitative surface recombination imaging of single side processed silicon wafers obtained by photoluminescence modeling', 4th International Conference on Crystalline Silicon Photovoltaics, SiliconPV 2014, ed. e A.Sinton R.Hahn G., Elsevier, Netherlands, pp. 63-70.

Year

2014

Field of Research

  • Photodetectors, Optical Sensors And Solar Cells

Updated:  29 September 2021 / Responsible Officer:  Director (Research Services Division) / Page Contact:  Researchers