Effect of Microstructure on Dielectric Breakdown in Amorphous HfO2 Films

Citation

Nandi, S, Llewellyn, D, Belay, K et al 2014, 'Effect of Microstructure on Dielectric Breakdown in Amorphous HfO2 Films', Microscopy and Microanalysis, vol. 20, no. 3.

Year

2014

Field of Research

  • Surfaces And Structural Properties Of Condensed Matter

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